Kimberly Nicholson

Research

My PhD research is primarily based on investigating extended defect characterisation of MOCVD grown III-nitrides materials at wafer scale and devices such as LEDs and HEMT using non-destructive multimodal micro-spectroscopy techniques. These include Raman spectroscopy and Scanning Electron Microsscopy (SEM)-based techniques such as Electron Channeling Imaging Constrast (ECCI), Cathodoluminescence (CL), Electron Back Scatter Diffraction (EBSD) and Energy Disspersive X-ray spectrometry (EDX).

Additionally, destructive EM techinques such as focused ion beam (FIB) for Transmission Electron Microscopy (TEM) will be explored.