Kimberly Nicholson

Research

My PhD research is primarily based on investigating extended defect characterisation of MOCVD grown III-nitrides materials and devices using non-destructive multimodal micro-spectroscopy techniques such as Raman spectroscopy, x-ray diffraction (XRD) and Scanning Electron Microsscopy (SEM)-based techniques: Electron Channeling Imaging Constrast (ECCI), Cathodoluminescence (CL), Electron Back Scatter Diffraction (EBSD) and Electron Beam Induced Current (EBIC) for the next generaion lighting sources.