Miss Yuwei Wan

Xu, M., Zhu, B., Chen, C. and Wan, Y. 2022. On-line recognition of abnormal patterns in bivariate autocorrelated process using random forest. Computers, Materials & Continua 73(1), pp. 1707-1722. (10.32604/cmc.2022.027708)
Wan, Y., Chen, Z., Hu, F., Liu, Y., Packianather, M. and Wang, R. 2022. Exploiting knowledge graph for multi-faceted conceptual modelling using GCN. Presented at: 3rd International Conference on Industry 4.0 and Smart Manufacturing (ISM 2021), Linz, Austria, 17-19 November 2021, Vol. 200. Procedia Computer Science, Vol 200 pp. 1174-1183., (10.1016/j.procs.2022.01.317)

Zhang, H., Zhu, B., Pang, K., Chen, C. and Wan, Y. 2021. Identification of abnormal patterns in AR (1) process using CS-SVM. Intelligent Automation and Soft Computing 28(3), pp. 797-810. (10.32604/iasc.2021.017232)

Xu, M., Zhu, B., Chen, C. and Wan, Y. 2022. On-line recognition of abnormal patterns in bivariate autocorrelated process using random forest. Computers, Materials & Continua 73(1), pp. 1707-1722. (10.32604/cmc.2022.027708)
Zhang, H., Zhu, B., Pang, K., Chen, C. and Wan, Y. 2021. Identification of abnormal patterns in AR (1) process using CS-SVM. Intelligent Automation and Soft Computing 28(3), pp. 797-810. (10.32604/iasc.2021.017232)

Wan, Y., Chen, Z., Hu, F., Liu, Y., Packianather, M. and Wang, R. 2022. Exploiting knowledge graph for multi-faceted conceptual modelling using GCN. Presented at: 3rd International Conference on Industry 4.0 and Smart Manufacturing (ISM 2021), Linz, Austria, 17-19 November 2021, Vol. 200. Procedia Computer Science, Vol 200 pp. 1174-1183., (10.1016/j.procs.2022.01.317)

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